Project funded by the EC within the 6th Framework Programme
 
 
 
 
 
 
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3C-SiC Characterization /  c) Electrical
 
N°1
 
3C-SiC layer on 6H-SiC substrate during MOS capacitance measurements
 
N°2
 
Admittance spectroscopy of a
3C-SiC layer grown by VLS
 
N°3
 
Test structures made
on 3C-SiC grown on Si