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3C-SiC Characterization / b) Optical
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N°1 |
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Photoluminescence spectrum recorded at low temperature on a bulk 3C-SiC material grown by CF-PVT.
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N°2 |
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Scheme of the optical setup for the picosecond grating technique.
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N°3 |
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Experimental apparatus used ofr the picosecond grating technique.
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